An efficient parallel transparent diagnostic BIST

In this paper, we propose a new transparent Built-In Self-Diagnosis ( BISD ) method to diagnose multiple embedded memory arrays with various sizes an parallel. A new tmnspamnt diagnostic interface has been proposed to perform testing in n m l mode. By tolerating redundant read/urite/shift operations, we develop a new mamh algorithm called TDiagRSMarch to achieve the y w l s of low hardware overhead, lower test time, and hiyh test coverage. Experh"ea1 results demonstrate that the diagnostic e f l ciency of TDiagRSMamh is independent on m e w r y topology, defect-type distribution, and degree of pamllelism. I n d a Words: Memory Test, Built-In Self-Diagnosis, II)ansparent diagnosis